Combined atomic force microscope-based topographical imaging and nanometer-scale resolved proximal probe thermal desorption/electrospray ionization-mass spectrometry.
about
Microscopy ambient ionization top-down mass spectrometry reveals developmental patterningLaser microdissection and atmospheric pressure chemical ionization mass spectrometry coupled for multimodal imaging.In vivo endoscopic mass spectrometry using a moving string sampling probe.Nanopipettes: probes for local sample analysis.Active capillary plasma source for ambient mass spectrometry.Towards Practical Endoscopic Mass Spectrometry.Temperature measurements of heated microcantilevers using scanning thermoreflectance microscopy.Improved spatial resolution for spot sampling in thermal desorption atomic force microscopy - mass spectrometry via rapid heating functions.Tip-enhanced ablation and ionization mass spectrometry for nanoscale chemical analysis.Probe-Substrate Distance Control in Desorption Electrospray Ionization.High sensitivity field asymmetric ion mobility spectrometer.Local collection, reaction and analysis with theta pipette emitters.
P2860
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P2860
Combined atomic force microscope-based topographical imaging and nanometer-scale resolved proximal probe thermal desorption/electrospray ionization-mass spectrometry.
description
2011 nî lūn-bûn
@nan
2011 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Combined atomic force microsco ...... ionization-mass spectrometry.
@ast
Combined atomic force microsco ...... ionization-mass spectrometry.
@en
type
label
Combined atomic force microsco ...... ionization-mass spectrometry.
@ast
Combined atomic force microsco ...... ionization-mass spectrometry.
@en
prefLabel
Combined atomic force microsco ...... ionization-mass spectrometry.
@ast
Combined atomic force microsco ...... ionization-mass spectrometry.
@en
P2093
P356
P1433
P1476
Combined atomic force microsco ...... ionization-mass spectrometry.
@en
P2093
Gary J Van Berkel
James A Bradshaw
Maxim P Nikiforov
Olga S Ovchinnikova
P304
P356
10.1021/NN200939E
P407
P577
2011-06-06T00:00:00Z