The butterfly - a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations.
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The butterfly - a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations.
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2016 nî lūn-bûn
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2016年の論文
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2016年学术文章
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The butterfly - a well-defined constant-current topography pattern on Si
@nl
The butterfly - a well-defined ...... t-induced defect fluctuations.
@en
type
label
The butterfly - a well-defined constant-current topography pattern on Si
@nl
The butterfly - a well-defined ...... t-induced defect fluctuations.
@en
prefLabel
The butterfly - a well-defined constant-current topography pattern on Si
@nl
The butterfly - a well-defined ...... t-induced defect fluctuations.
@en
P2093
P2860
P50
P356
P1476
The butterfly - a well-defined ...... t-induced defect fluctuations.
@en
P2093
Bartosz Such
Marek Szymonski
Rafał Zuzak
Szymon Godlewski
P2860
P304
19309-19317
P356
10.1039/C6CP04031D
P407
P577
2016-07-04T00:00:00Z