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PNAS.1222325110
PNAS.1222325110
http://dx.doi.org/10.1073/PNAS.1222325110
Depth-profiling X-ray photoelectron spectroscopy (XPS) analysis of interlayer diffusion in polyelectrolyte multilayers.
P356
Q36799274-E8C81D42-3289-4989-A01F-0C4B4F19D5AA
P356
PNAS.1222325110
http://dx.doi.org/10.1073/PNAS.1222325110