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Continuum models of focused electron beam induced processing

Continuum models of focused electron beam induced processing

http://www.wikidata.org/entity/Q26783318

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Focused particle beam-induced processing.Synthesis of [{AgO2CCH2OMe(PPh3)} n ] and theoretical study of its use in focused electron beam induced deposition.Comparative study of post-growth annealing of Cu(hfac)2, Co2(CO)8 and Me2Au(acac) metal precursors deposited by FEBID.Modelling focused electron beam induced deposition beyond Langmuir adsorption.Dynamic Pattern Formation in Electron-Beam-Induced Etching.Formation mechanisms of boron oxide films fabricated by large-area electron beam-induced deposition of trimethyl borate.Pattern generation for direct-write three-dimensional nanoscale structures via focused electron beam induced deposition

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Continuum models of focused electron beam induced processing

http://www.wikidata.org/entity/Q26783318

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2015 nî lūn-bûn

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2015 թուականին հրատարակուած գիտական յօդուած

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2015 թվականին հրատարակված գիտական հոդված

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2015年の論文

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2015年学术文章

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Continuum models of focused electron beam induced processing

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Continuum models of focused electron beam induced processing

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Continuum models of focused electron beam induced processing

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Continuum models of focused electron beam induced processing

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Continuum models of focused electron beam induced processing

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Continuum models of focused electron beam induced processing

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prefLabel

Continuum models of focused electron beam induced processing

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Continuum models of focused electron beam induced processing

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Continuum models of focused electron beam induced processing

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Beilstein Journal of Nanotechnology

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Continuum models of focused electron beam induced processing

@en

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Aleksandra Szkudlarek

http://www.w3.org/2001/XMLSchema#string

Ivo Utke

http://www.w3.org/2001/XMLSchema#string

Vinzenz Friedli

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Structure of wet specimens in electron microscopy. Improved environmental chambers make it possible to examine wet specimens easily.

Focused electron beam induced deposition: A perspective

Nanoscale electron beam induced etching: a continuum model that correlates the etch profile to the experimental parameters.

Understanding the kinetics and nanoscale morphology of electron-beam-induced deposition via a three-dimensional Monte Carlo simulation: the effects of the precursor molecule and the deposited material.

High resolution radially symmetric nanostructures from simultaneous electron beam induced etching and deposition.

Toward ultraflat surface morphologies during focused electron beam induced nanosynthesis: disruption origins and compensation.

Determination of the surface diffusion coefficient and the residence time of adsorbates via local focused electron beam induced chemical vapour deposition.

Binary Pt–Si Nanostructures Prepared by Focused Electron-Beam-Induced Deposition

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1518-1540

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scholarly article

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10.3762/BJNANO.6.157

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6

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Charlene J. Lobo

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2015-07-14T00:00:00Z

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281801502

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26425405

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4578401

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