Cluster secondary ion mass spectrometry of polymers and related materials.

Cluster secondary ion mass spectrometry of polymers and related materials.

Item
http://www.wikidata.org/entity/Q37486311
ToF-SIMS analysis of a polymer microarray composed of poly(meth)acrylates with C6 derivative pendant groupsLipid imaging with time-of-flight secondary ion mass spectrometry (ToF-SIMS).Identifying individual cell types in heterogeneous cultures using secondary ion mass spectrometry imaging with C60 etching and multivariate analysis.Molecular imaging of biological tissue using gas cluster ionsReduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams.Depth-profiling X-ray photoelectron spectroscopy (XPS) analysis of interlayer diffusion in polyelectrolyte multilayers.Reagent cluster anions for multiple gas-phase covalent modifications of peptide and protein cations.TOF-SIMS 3D imaging of native and non-native species within HeLa cells.Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy.Enhancing secondary ion yields in time of flight-secondary ion mass spectrometry using water cluster primary beams.Surface Characterization of Polymer Blends by XPS and ToF-SIMS.Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis.
P2860

Cluster secondary ion mass spectrometry of polymers and related materials.

Item
http://www.wikidata.org/entity/Q37486311
description
article científic
@ca
article scientifique
@fr
articolo scientifico
@it
artigo científico
@pt
bilimsel makale
@tr
scientific article published on March 2010
@en
vedecký článok
@sk
vetenskaplig artikel
@sv
videnskabelig artikel
@da
vědecký článek
@cs
name
Cluster secondary ion mass spectrometry of polymers and related materials.
@en
Cluster secondary ion mass spectrometry of polymers and related materials.
@nl
type
label
Cluster secondary ion mass spectrometry of polymers and related materials.
@en
Cluster secondary ion mass spectrometry of polymers and related materials.
@nl
prefLabel
Cluster secondary ion mass spectrometry of polymers and related materials.
@en
Cluster secondary ion mass spectrometry of polymers and related materials.
@nl
P1433
P1476
P2093
P304
P31
P356
P433
P478
P577
P5875
P698
P356
P1433
P1476
Cluster secondary ion mass spectrometry of polymers and related materials.
@en
P2093
P304
P31
P356
P433
P478
P577
P5875
P698