Kelvin probe force microscope
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). With KPFM, the work function of surfaces can be observed at atomic or molecular scales. The work function relates to many surface phenomena, including catalytic activity, reconstruction of surfaces, doping and band-bending of semiconductors, charge trapping in dielectrics and corrosion. The map of the work function produced by KPFM gives information about the composition and electronic state of the local structures on the surface of a solid.
primaryTopic
Kelvin probe force microscope
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). With KPFM, the work function of surfaces can be observed at atomic or molecular scales. The work function relates to many surface phenomena, including catalytic activity, reconstruction of surfaces, doping and band-bending of semiconductors, charge trapping in dielectrics and corrosion. The map of the work function produced by KPFM gives information about the composition and electronic state of the local structures on the surface of a solid.
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Die Kelvin-Sonde (englisch Kel ...... e geht auf Lord Kelvin zurück.
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Kelvin probe force microscopy ...... ed silicon or silicon nitride.
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开尔文探针力显微鏡（Kelvin probe force m ...... 品原子之間的作用力，從而達到檢測的目的，具有原子級的分辨率。
@zh
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Die Kelvin-Sonde (englisch Kel ...... e geht auf Lord Kelvin zurück.
@de
Kelvin probe force microscopy ...... res on the surface of a solid.
@en
开尔文探针力显微鏡（Kelvin probe force m ...... 品原子之間的作用力，從而達到檢測的目的，具有原子級的分辨率。
@zh
label
Kelvin probe force microscope
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Kelvin-Sonde
@de
开尔文探针力显微鏡
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