The scanning helium microscope (SHeM) is a novel form of microscopy that uses low energy (5-100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces. Images are formed by rastering a sample underneath an atom beam and monitoring the flux of atoms that are scattered into a detector at each point. The technique is different from a scanning helium ion microscope which uses charged helium ions that can cause damage to a surface.