Electrostatic force microscope
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-range force and can be detected 100 nm or more from the sample.
Wikipage disambiguates
Wikipage redirect
primaryTopic
Electrostatic force microscope
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-range force and can be detected 100 nm or more from the sample.
has abstract
Electrostatic force microscopy ...... 00 nm or more from the sample.
@en
Mikroskopia sił elektrostatycz ...... nia aktywnych mikroprocesorów.
@pl
ン 静电力显微镜（英語：Electrostatic Forc ...... 样品表面静电势能，电荷分布以及电荷输运的[扫描探针显微镜]。
@zh
静電気力顕微鏡（せいでんきりょくけんびきょう、Electrostatic Force Microscope : EFM）は走査型プローブ顕微鏡の一種。
@ja
Link from a Wikipage to an external page
Wikipage page ID
page length (characters) of wiki page
Wikipage revision ID
821,644,767
Link from a Wikipage to another Wikipage
wikiPageUsesTemplate
subject
comment
Electrostatic force microscopy ...... 00 nm or more from the sample.
@en
Mikroskopia sił elektrostatycz ...... nia aktywnych mikroprocesorów.
@pl
ン 静电力显微镜（英語：Electrostatic Forc ...... 样品表面静电势能，电荷分布以及电荷输运的[扫描探针显微镜]。
@zh
静電気力顕微鏡（せいでんきりょくけんびきょう、Electrostatic Force Microscope : EFM）は走査型プローブ顕微鏡の一種。
@ja
label
Electrostatic force microscope
@en
Mikroskopia sił elektrostatycznych
@pl
静电力显微镜
@zh
静電気力顕微鏡
@ja