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1
OL.35.000208
OL.35.000208
http://dx.doi.org/10.1364/OL.35.000208
Topography and refractometry of nanostructures using spatial light interference microscopy.
P356
Q41762230-84E6C09E-ECCC-4959-A686-ABEED2E18C00
P356
OL.35.000208
http://dx.doi.org/10.1364/OL.35.000208