The Diffraction Pattern Calculator (DPC) toolkit: a user-friendly approach to unit-cell lattice parameter identification of two-dimensional grazing-incidence wide-angle X-ray scattering data
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Isoindigo-Containing Molecular Semiconductors: Effect of Backbone Extension on Molecular Organization and Organic Solar Cell Performance.Understanding the Crystal Packing and Organic Thin-Film Transistor Performance in Isomeric Guest-Host Systems.Crystallization and Polymorphism of Organic Semiconductor in Thin Film Induced by Surface Segregated Monolayers.Eliminating Piezoresistivity in Flexible Conducting Polymers for Accurate Temperature Sensing under Dynamic Mechanical Deformations.
P2860
The Diffraction Pattern Calculator (DPC) toolkit: a user-friendly approach to unit-cell lattice parameter identification of two-dimensional grazing-incidence wide-angle X-ray scattering data
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The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
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The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
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The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
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The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
@ast
The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
@en
The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
@nl
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The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
@ast
The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
@en
The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
@nl
P2093
P2860
P1476
The Diffraction Pattern Calcul ...... de-angle X-ray scattering data
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P2093
Anna K Hailey
Anna M Hiszpanski
Yueh-Lin Loo
P2860
P304
P356
10.1107/S1600576714022006
P577
2014-11-18T00:00:00Z