Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy - Wikidata - awgldk - TriplyDB

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

http://www.wikidata.org/entity/Q27450545

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Roughening Rates of Strained-Layer Instabilities Flexible drift-compensation system for precise 3D force mapping in severe drift environments.Active drift compensation applied to nanorod manipulation with an atomic force microscope.Accurately determining single molecule trajectories of molecular motion on surfaces.Temperature calibration for diffusion experiments to sub-Kelvin precision.Direct observation of the dynamics of single metal ions at the interface with solids in aqueous solutions.Studying the dynamic behaviour of porphyrins as prototype functional molecules by scanning tunnelling microscopy close to room temperature.Diffusion kinetics in the Pd/Cu(001) surface alloy.Diffusional kinetics of SiGe dimers on Si(100) using atom-tracking scanning tunneling microscopy Anomalous Dynamical Behavior of Freestanding Graphene Membranes.Differential Electrochemical Conductance Imaging at the Nanoscale.Modelization of surface diffusion of a molecular dimer.Optical phonon sidebands of electronic intersubband absorption in strongly polar semiconductor heterostructures.Scanning nonlinear dielectric potentiometry.Experimental and Theoretical Study of the Rotation of Si Ad-dimers on the Si(100) Surface Si(001) step dynamics: A temporal low-energy electron diffraction study Cross-correlation image tracking for drift correction and adsorbate analysis Unusual ultra-low-frequency fluctuations in freestanding graphene

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P2860

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

http://www.wikidata.org/entity/Q27450545

description

1996 nî lūn-bûn

@nan

1996 թուականի Յունուարին հրատարակուած գիտական յօդուած

@hyw

1996 թվականի հունվարին հրատարակված գիտական հոդված

@hy

1996年の論文

@ja

1996年論文

@yue

1996年論文

@zh-hant

1996年論文

@zh-hk

1996年論文

@zh-mo

1996年論文

@zh-tw

1996年论文

@wuu

name

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@ast

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@en

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@nl

type

label

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@ast

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@en

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@nl

prefLabel

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@ast

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@en

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@nl

P1433

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P2860

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P356

PHYSREVLETT.76.459

P1433

Physical Review Letters

P1476

Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

@en

P2093

B. S. Swartzentruber

http://www.w3.org/2001/XMLSchema#string

P2860

Atomic-scale desorption through electronic and vibrational excitation mechanisms.

Atomic and molecular manipulation with the scanning tunneling microscope.

Reversible rotation of antimony dimers on the silicon (001) surface with a scanning tunneling microscope.

Si-adatom dynamics and mechanisms of the epitaxial growth on a single-height-stepped Si{001} surface.

P304

459-462

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scholarly article

P356

10.1103/PHYSREVLETT.76.459

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P407

P433

3

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P478

76

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P577

1996-01-01T00:00:00Z

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1996-01-15T00:00:00Z

http://www.w3.org/2001/XMLSchema#dateTime

P698

10061462

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