Focused helium-ion beam irradiation effects on electrical transport properties of few-layer WSe2: enabling nanoscale direct write homo-junctions.
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Focused helium-ion beam irradiation effects on electrical transport properties of few-layer WSe2: enabling nanoscale direct write homo-junctions.
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2016 nî lūn-bûn
@nan
2016 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2016 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2016年の論文
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2016年論文
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2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
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Focused helium-ion beam irradi ...... e direct write homo-junctions.
@ast
Focused helium-ion beam irradi ...... e direct write homo-junctions.
@en
type
label
Focused helium-ion beam irradi ...... e direct write homo-junctions.
@ast
Focused helium-ion beam irradi ...... e direct write homo-junctions.
@en
prefLabel
Focused helium-ion beam irradi ...... e direct write homo-junctions.
@ast
Focused helium-ion beam irradi ...... e direct write homo-junctions.
@en
P2093
P2860
P50
P356
P1433
P1476
Focused helium-ion beam irradi ...... e direct write homo-junctions.
@en
P2093
Alex Belianinov
David G Mandrus
Joo Hyon Noh
Michael G Stanford
Michael R Koehler
Nicholas Cross
Pushpa Raj Pudasaini
P2860
P2888
P356
10.1038/SREP27276
P407
P577
2016-06-06T00:00:00Z
P6179
1004390416