Quantification of high-resolution electron microscope images of amorphous carbon
about
Using molecular dynamics to quantify the electrical double layer and examine the potential for its direct observation in the in-situ TEMSimulating realistic imaging conditions for in situ liquid microscopy."Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.Advanced electron microscopy for advanced materials.Snapshot 3D Electron Imaging of Structural Dynamics.
P2860
Quantification of high-resolution electron microscope images of amorphous carbon
description
2000 nî lūn-bûn
@nan
2000 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2000 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2000年の論文
@ja
2000年論文
@yue
2000年論文
@zh-hant
2000年論文
@zh-hk
2000年論文
@zh-mo
2000年論文
@zh-tw
2000年论文
@wuu
name
Quantification of high-resolution electron microscope images of amorphous carbon
@ast
Quantification of high-resolution electron microscope images of amorphous carbon
@en
type
label
Quantification of high-resolution electron microscope images of amorphous carbon
@ast
Quantification of high-resolution electron microscope images of amorphous carbon
@en
prefLabel
Quantification of high-resolution electron microscope images of amorphous carbon
@ast
Quantification of high-resolution electron microscope images of amorphous carbon
@en
P1433
P1476
Quantification of high-resolution electron microscope images of amorphous carbon
@en
P2093
Boothroyd CB
P304
P356
10.1016/S0304-3991(00)00012-7
P577
2000-06-01T00:00:00Z