Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffraction.
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Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffraction.
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2002 nî lūn-bûn
@nan
2002 թուականի Մարտին հրատարակուած գիտական յօդուած
@hyw
2002 թվականի մարտին հրատարակված գիտական հոդված
@hy
2002年の論文
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2002年論文
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2002年論文
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2002年論文
@zh-hk
2002年論文
@zh-mo
2002年論文
@zh-tw
2002年论文
@wuu
name
Characterizing the deformed st ...... ron backscattered diffraction.
@ast
Characterizing the deformed st ...... ron backscattered diffraction.
@en
type
label
Characterizing the deformed st ...... ron backscattered diffraction.
@ast
Characterizing the deformed st ...... ron backscattered diffraction.
@en
prefLabel
Characterizing the deformed st ...... ron backscattered diffraction.
@ast
Characterizing the deformed st ...... ron backscattered diffraction.
@en
P1476
Characterizing the deformed st ...... ron backscattered diffraction.
@en
P2093
Humphreys FJ
P304
P356
10.1046/J.1365-2818.2002.00997.X
P577
2002-03-01T00:00:00Z