Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
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Local band gap measurements by VEELS of thin film solar cells.Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELS.Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and SensitivityQuantum confinement of volume plasmons and interband transitions in germanium nanocrystalsAdvanced analytical electron microscopy for lithium-ion batteries
P2860
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
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2007 nî lūn-bûn
@nan
2007 թուականի Հոկտեմբերին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի հոտեմբերին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
@ast
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
@en
type
label
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
@ast
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
@en
prefLabel
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
@ast
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
@en
P2093
P1433
P1476
Prospects for analyzing the electronic properties in nanoscale systems by VEELS.
@en
P2093
Nigel D Browning
Sorin Lazar
P304
P356
10.1016/J.ULTRAMIC.2007.07.008
P577
2007-10-22T00:00:00Z