about
The contributions of Otto Scherzer (1909-1982) to the development of the electron microscope.Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging.Micrographia of the twenty-first century: from camera obscura to 4D microscopy.Protein-RNA interactions: structural biology and computational modeling techniques.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.Fast deterministic ptychographic imaging using X-rays.New possibilities with aberration-corrected electron microscopy.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.Lens Aberrations: Diagnosis and CorrectionAberration correction for low voltage optimized transmission electron microscopy
P2860
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P2860
description
2009 nî lūn-bûn
@nan
2009 թուականի Սեպտեմբերին հրատարակուած գիտական յօդուած
@hyw
2009 թվականի սեպտեմբերին հրատարակված գիտական հոդված
@hy
2009年の論文
@ja
2009年論文
@yue
2009年論文
@zh-hant
2009年論文
@zh-hk
2009年論文
@zh-mo
2009年論文
@zh-tw
2009年论文
@wuu
name
Aberration correction past and present.
@ast
Aberration correction past and present.
@en
type
label
Aberration correction past and present.
@ast
Aberration correction past and present.
@en
prefLabel
Aberration correction past and present.
@ast
Aberration correction past and present.
@en
P2860
P356
P1476
Aberration correction past and present.
@en
P2093
P W Hawkes
P2860
P304
P356
10.1098/RSTA.2009.0004
P407
P577
2009-09-01T00:00:00Z