"Depth-profiling" and quantitative characterization of the size, composition, shape, density, and morphology of fine particles with SPLAT, a single-particle mass spectrometer.
about
Mass spectrometry of atmospheric aerosols--recent developments and applications. Part II: On-line mass spectrometry techniques.Real time in situ chemical characterization of sub-micron organic aerosols using Direct Analysis in Real Time mass spectrometry (DART-MS): the effect of aerosol size and volatility.Morphology of mixed primary and secondary organic particles and the adsorption of spectator organic gases during aerosol formationCharacterization of core-shell MOF particles by depth profiling experiments using on-line single particle mass spectrometry.The effect of gas-phase polycyclic aromatic hydrocarbons on the formation and properties of biogenic secondary organic aerosol particles.Experimental determination of chemical diffusion within secondary organic aerosol particles.The properties and behavior of α-pinene secondary organic aerosol particles exposed to ammonia under dry conditions.Impacts of Aerosol Aging on Laser Desorption/Ionization in Single-Particle Mass SpectrometersSPLAT II: An Aircraft Compatible, Ultra-Sensitive, High Precision Instrument for In-Situ Characterization of the Size and Composition of Fine and Ultrafine ParticlesExtending the Capabilities of Single Particle Mass Spectrometry: II. Measurements of Aerosol Particle Density without DMA
P2860
Q33449937-A25AEE08-E264-4567-98E2-77BA59F792F3Q33458035-D6A7C926-6F53-4D2F-AB2A-D260128D5EECQ33535673-160060A2-B126-427A-A96E-052D4CFA8F0DQ35542614-7E5D829F-D002-4EE8-A749-68270296210CQ38674771-DEBA2AC9-80A5-4D71-8D6E-B21124DEB5FFQ46398724-3FB72D10-3C5B-4EC1-9D00-DD572761F9BFQ48236799-4CDE4AAA-195C-4DB7-B4D0-4C991CFF404FQ58068603-92965C04-B279-47AE-8A0A-9947397AABA9Q58096178-4D676CCB-C321-4BFA-9F4B-F1F2028AFCEAQ58301977-F714826E-B07B-42A3-A3B9-63611B9710BB
P2860
"Depth-profiling" and quantitative characterization of the size, composition, shape, density, and morphology of fine particles with SPLAT, a single-particle mass spectrometer.
description
2008 nî lūn-bûn
@nan
2008 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
2008 թվականի հունվարին հրատարակված գիտական հոդված
@hy
2008年の論文
@ja
2008年論文
@yue
2008年論文
@zh-hant
2008年論文
@zh-hk
2008年論文
@zh-mo
2008年論文
@zh-tw
2008年论文
@wuu
name
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@ast
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@en
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@nl
type
label
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@ast
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@en
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@nl
prefLabel
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@ast
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@en
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@nl
P2093
P356
P1476
"Depth-profiling" and quantita ...... le-particle mass spectrometer.
@en
P2093
Alla Zelenyuk
P304
P356
10.1021/JP077308Y
P407
P577
2008-01-04T00:00:00Z