A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy.
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High density single-molecule-bead arrays for parallel single molecule force spectroscopyAssembly of gold nanowires by sedimentation from suspension: Experiments and simulation.Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy.Adhesion contact deformation in nanobridge tests.
P2860
A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy.
description
2007 nî lūn-bûn
@nan
2007 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի հունվարին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
A method to quantitatively eva ...... ct in atomic force microscopy.
@ast
A method to quantitatively eva ...... ct in atomic force microscopy.
@en
type
label
A method to quantitatively eva ...... ct in atomic force microscopy.
@ast
A method to quantitatively eva ...... ct in atomic force microscopy.
@en
prefLabel
A method to quantitatively eva ...... ct in atomic force microscopy.
@ast
A method to quantitatively eva ...... ct in atomic force microscopy.
@en
P2093
P356
P1433
P1476
A method to quantitatively eva ...... ct in atomic force microscopy.
@en
P2093
A K Raychaudhuri
P A Sreeram
P304
P356
10.1088/0957-4484/18/3/035501
P577
2007-01-03T00:00:00Z