Background, status and future of the Transmission Electron Aberration-corrected Microscope project.
about
Synthetic fossilization of soft biological tissues and their shape-preserving transformation into silica or electron-conductive replicasSub-angstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope.A fast image simulation algorithm for scanning transmission electron microscopy.Operation of TEAM I in a user environment at NCEM.Atomic resolution phase contrast imaging and in-line holography using variable voltage and dose rate.Retro-fitting an older (S)TEM with two Cs aberration correctors for 80 kV and 60 kV operation.Surface determination through atomically resolved secondary-electron imaging.Deciphering the physics and chemistry of perovskites with transmission electron microscopy.Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry.Industrial graphene metrology.Advanced electron microscopy for advanced materials.Atomic-scale tomography: a 2020 vision.Atomic structure from large-area, low-dose exposures of materials: a new route to circumvent radiation damage.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.In Situ Transmission Electron Microscopy Characterization and Manipulation of Two-Dimensional Layered Materials beyond Graphene.Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution.New possibilities with aberration-corrected electron microscopy.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.Low Voltage High-Resolution Transmission Electron MicroscopyResearch Updates: Epitaxial strain relaxation and associated interfacial reconstructions: The driving force for creating new structures with integrated functionality
P2860
Q28649632-C81B100C-5DC8-4EC9-A823-5BB5703F9EA0Q30475156-6CA4765A-1C7F-4B1F-81FC-D76E79B8D9E3Q33653712-1E7B5645-7B6D-4B60-B784-595035C4042DQ34360386-6785D151-52DF-4E0F-AACF-B24053AAE2FBQ34452990-FED03519-D617-40D5-986E-FC39B8DD8303Q34487160-33869FA3-75D7-4185-8401-3C483F5E65A7Q35665595-E1B54444-532D-4693-9CBB-0B5EDFEBB70BQ35893215-C31A3391-D0AB-44C6-B445-1BE04738B78FQ36637213-9B138DD2-0999-4715-A8A0-35772EBB684BQ38005932-CA326360-5336-400E-8913-46BC1C0E1402Q38036191-F986FC5A-8529-46D5-A36F-3157E50A8EDBQ38106506-ED348BBB-38F8-41ED-9B02-BDF35CC4B124Q41931199-201B02FD-445D-406E-84E0-0175D4D744AAQ46464918-1EA1CD6B-715E-4A0F-ABDC-2B4796E302DAQ47824839-6BBA9F0C-69E2-4E28-BEEF-752D1A1CA0B5Q49635657-833EC14F-C4F4-43AF-9E63-F90F829D5B2CQ51800978-303E5313-16A1-4BD7-8BDC-46CE02AF467FQ54863144-7829D7FC-13E1-4E5D-AA5D-C410859B88FFQ57341101-EE8DF8CD-A28A-456B-9D5E-ACD5E286D8E8Q57425034-8BAB44A6-7889-4A76-9EEB-B52546A4EAD6
P2860
Background, status and future of the Transmission Electron Aberration-corrected Microscope project.
description
2009 nî lūn-bûn
@nan
2009 թուականի Սեպտեմբերին հրատարակուած գիտական յօդուած
@hyw
2009 թվականի սեպտեմբերին հրատարակված գիտական հոդված
@hy
2009年の論文
@ja
2009年論文
@yue
2009年論文
@zh-hant
2009年論文
@zh-hk
2009年論文
@zh-mo
2009年論文
@zh-tw
2009年论文
@wuu
name
Background, status and future ...... -corrected Microscope project.
@ast
Background, status and future ...... -corrected Microscope project.
@en
type
label
Background, status and future ...... -corrected Microscope project.
@ast
Background, status and future ...... -corrected Microscope project.
@en
prefLabel
Background, status and future ...... -corrected Microscope project.
@ast
Background, status and future ...... -corrected Microscope project.
@en
P2093
P2860
P356
P1476
Background, status and future ...... -corrected Microscope project.
@en
P2093
Christian Ksielowski
Marta-Dacil Rossell
Peter Denes
Ulrich Dahmen
Velimir Radmilovic
P2860
P304
P356
10.1098/RSTA.2009.0094
P407
P577
2009-09-01T00:00:00Z