C60+ secondary ion microscopy using a delay line detector.
about
Mass spectrometric imaging for biomedical tissue analysisThe application of the fast, multi-hit, pixel imaging mass spectrometry sensor to spatial imaging mass spectrometry.Microscope mode secondary ion mass spectrometry imaging with a Timepix detector.SIMS instrumentation and methodology for mapping of co-localized molecules.Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging.Time-resolved imaging of the MALDI linear-TOF ion cloud: direct visualization and exploitation of ion optical phenomena using a position- and time-sensitive detector.Fast sensors for time-of-flight imaging applications.Detection systems for mass spectrometry imaging: a perspective on novel developments with a focus on active pixel detectors.Modifications to a commercially available linear mass spectrometer for mass-resolved microscopy with the pixel imaging mass spectrometry (PImMS) camera.
P2860
Q30475508-98CE08D4-BEB6-44C4-A121-D16142815C26Q34498384-71B5E14C-F33D-44E4-BC74-FF08FD16B6C2Q34578500-43C4CB23-7C30-45A3-A937-016679E5FDA4Q35030501-E8D1405C-E974-4407-95B7-B56D577E433FQ35038244-5FA0009B-FE51-46E9-BC96-DA5E3B3B4082Q35128406-EBABA8F0-DA1A-462A-BD5C-F52A57A75CAEQ38133966-D747BCE9-50F6-44D6-AE18-10259B105172Q39503460-A10132A0-5397-4186-B07B-4E7E1FFC2B84Q53061444-8F992675-B2D5-4AB8-9DE8-047A266CFC9D
P2860
C60+ secondary ion microscopy using a delay line detector.
description
2010 nî lūn-bûn
@nan
2010 թուականի Փետրուարին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի փետրվարին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年学术文章
@wuu
2010年学术文章
@zh-cn
2010年学术文章
@zh-hans
2010年学术文章
@zh-my
2010年学术文章
@zh-sg
2010年學術文章
@yue
name
C60+ secondary ion microscopy using a delay line detector.
@ast
C60+ secondary ion microscopy using a delay line detector.
@en
C60+ secondary ion microscopy using a delay line detector.
@nl
type
label
C60+ secondary ion microscopy using a delay line detector.
@ast
C60+ secondary ion microscopy using a delay line detector.
@en
C60+ secondary ion microscopy using a delay line detector.
@nl
prefLabel
C60+ secondary ion microscopy using a delay line detector.
@ast
C60+ secondary ion microscopy using a delay line detector.
@en
C60+ secondary ion microscopy using a delay line detector.
@nl
P2093
P356
P1433
P1476
C60+ secondary ion microscopy using a delay line detector
@en
P2093
Andriy Kharchenko
John C Vickerman
Leendert A Klerk
Nicholas P Lockyer
Patricia Y W Dankers
P304
P356
10.1021/AC902587G
P407
P577
2010-02-01T00:00:00Z