Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy.
about
Development of a hybrid atomic force microscopic measurement system combined with white light scanning interferometry.A diamond-based scanning probe spin sensor operating at low temperature in ultra-high vacuum.Mechanically stable tuning fork sensor with high quality factor for the atomic force microscope.A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes.Voltage preamplifier for extensional quartz sensors used in scanning force microscopy.Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end.A novel self-sensing technique for tapping-mode atomic force microscopy.Resonant torsion magnetometry in anisotropic quantum materials
P2860
Q34173187-39B1BE47-EC8E-4FAB-9765-DAE30283A48EQ35092180-9554F6D1-7B4C-4018-8996-DAF915BBB379Q35257763-EBF486A9-0A6D-46C0-9528-B00CE80D6DC3Q35845164-4EB510DD-3815-4087-8134-F338782D3A8BQ39733330-8AE8FD4B-CAC0-4A06-B298-18B0DDB65E24Q42039174-CC6F7D78-36D3-4DEA-B550-ECCE681F38A9Q44120482-ACD94E4B-C44A-4824-B565-80DCB9ED8CBFQ59126231-028D06B7-C0B0-416D-A14F-D50493E2715E
P2860
Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy.
description
2010 nî lūn-bûn
@nan
2010 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
Implementation and characteriz ...... mode atomic force microscopy.
@ast
Implementation and characteriz ...... mode atomic force microscopy.
@en
type
label
Implementation and characteriz ...... mode atomic force microscopy.
@ast
Implementation and characteriz ...... mode atomic force microscopy.
@en
prefLabel
Implementation and characteriz ...... mode atomic force microscopy.
@ast
Implementation and characteriz ...... mode atomic force microscopy.
@en
P2093
P2860
P356
P1476
Implementation and characteriz ...... mode atomic force microscopy.
@en
P2093
Dominik Braendlin
Manfred Detterbeck
Martin Scheidiger
Nicolaas F de Rooij
Simon Waldmeier
Terunobu Akiyama
Urs Staufer
P2860
P304
P356
10.1063/1.3455219
P407
P577
2010-06-01T00:00:00Z