ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis.
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Secondary ion mass spectrometry imaging of Dictyostelium discoideum aggregation streamsBiomedical surface analysis: Evolution and future directions (Review)Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60 and giant argon gas cluster sourcesToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth ProfilesExploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic films.Identifying individual cell types in heterogeneous cultures using secondary ion mass spectrometry imaging with C60 etching and multivariate analysis.ToF-SIMS depth profiling of cells: z-correction, 3D imaging, and sputter rate of individual NIH/3T3 fibroblasts.Three-dimensional localization of polymer nanoparticles in cells using ToF-SIMS.Compositional mapping of the surface and interior of mammalian cells at submicrometer resolutionTOF-SIMS 3D imaging of native and non-native species within HeLa cells.Characterization of sample preparation methods of NIH/3T3 fibroblasts for ToF-SIMS analysis.Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic Multilayers.Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.
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P2860
ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis.
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2010 nî lūn-bûn
@nan
2010 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի հունվարին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
ToF-SIMS Depth Profiling of Or ...... e Beam and Dual-beam Analysis.
@ast
ToF-SIMS Depth Profiling of Or ...... e Beam and Dual-beam Analysis.
@en
type
label
ToF-SIMS Depth Profiling of Or ...... e Beam and Dual-beam Analysis.
@ast
ToF-SIMS Depth Profiling of Or ...... e Beam and Dual-beam Analysis.
@en
prefLabel
ToF-SIMS Depth Profiling of Or ...... e Beam and Dual-beam Analysis.
@ast
ToF-SIMS Depth Profiling of Or ...... e Beam and Dual-beam Analysis.
@en
P2093
P2860
P356
P1476
ToF-SIMS Depth Profiling of Or ...... e Beam and Dual-beam Analysis.
@en
P2093
David G Castner
S Muramoto
P2860
P304
P356
10.1021/JP9066179
P577
2010-01-01T00:00:00Z