Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
about
The influence of experimental parameters and specimen geometry on the mass spectra of copper during pulsed-laser atom-probe tomography.Quantifying Compositional Homogeneity in Pb(Zr,Ti)O3Using Atom Probe TomographyEffects of optical dopants and laser wavelength on atom probe tomography analyses of borosilicate glassesThe Optimization of Zircon Analyses by Laser‐Assisted Atom Probe Microscopy: Insights from the 91500 Zircon Standard
P2860
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
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2010 nî lūn-bûn
@nan
2010 թուականի Դեկտեմբերին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի դեկտեմբերին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
@ast
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
@en
type
label
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
@ast
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
@en
prefLabel
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
@ast
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
@en
P2093
P1433
P1476
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser.
@en
P2093
P304
P356
10.1016/J.ULTRAMIC.2010.12.011
P577
2010-12-15T00:00:00Z