A high frequency sensor for optical beam deflection atomic force microscopy.
about
Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging.High-frequency multimodal atomic force microscopy.Improving image contrast and material discrimination with nonlinear response in bimodal atomic force microscopy.High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers.High bandwidth deflection readout for atomic force microscopes.A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points.Nanoscale thermometry by scanning thermal microscopy.High-bandwidth multimode self-sensing in bimodal atomic force microscopyHigh speed two-dimensional optical beam position detector.Signal distortion in atomic force microscopy photodetector.
P2860
Q27306834-F0FB6C21-7DD3-40D5-8CD3-ED7F771A8818Q30419084-95AC2FC3-5269-4FF4-91B2-681D0B322ABFQ35139282-18446399-D650-4525-BB05-4B8AA7DEB8B8Q35292812-DDA3AC69-D968-4AC3-A539-582CA7543311Q35828531-76FCC9F5-746C-43CE-B90F-3F8A7EE60D46Q35858155-BE8C7CFB-3F49-4349-820D-7D7ED1BDAD50Q36090887-4D6D4539-115B-44DB-9038-51F2F2521376Q38781883-35B7864F-FE36-4F88-8C7C-F562EA4C63B6Q46671762-08FCA350-F9F2-4A32-A8E4-CF00F66EE721Q47390954-902D0F27-13D6-4860-962A-FE97041950F3
P2860
A high frequency sensor for optical beam deflection atomic force microscopy.
description
2011 nî lūn-bûn
@nan
2011 թուականի Ապրիլին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի ապրիլին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
A high frequency sensor for optical beam deflection atomic force microscopy.
@ast
A high frequency sensor for optical beam deflection atomic force microscopy.
@en
type
label
A high frequency sensor for optical beam deflection atomic force microscopy.
@ast
A high frequency sensor for optical beam deflection atomic force microscopy.
@en
prefLabel
A high frequency sensor for optical beam deflection atomic force microscopy.
@ast
A high frequency sensor for optical beam deflection atomic force microscopy.
@en
P2093
P2860
P356
P1476
A high frequency sensor for optical beam deflection atomic force microscopy.
@en
P2093
Adrian Nievergelt
Andreas Stemmer
Dominik Ziegler
Krithika Venkataramani
Ralph Friedlos
Raoul Enning
P2860
P304
P356
10.1063/1.3575322
P407
P577
2011-04-01T00:00:00Z