In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
about
Novel temperature dependent tensile test of freestanding copper thin film structures.A novel apparatus for in situ compression of submicron structures and particles in a high resolution SEM.Temperature controlled tensile testing of individual nanowires.A versatile atomic force microscope integrated with a scanning electron microscope.Thermomechanical Behavior of Molded Metallic Glass Nanowires.Strength, Hardening, and Failure Observed by In Situ TEM Tensile Testing.Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials.Tunable Tensile Ductility in Metallic Glasses.
P2860
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P2860
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
description
2011 nî lūn-bûn
@nan
2011 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
@ast
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
@en
type
label
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
@ast
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
@en
prefLabel
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
@ast
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
@en
P2093
P2860
P356
P1476
In situ nanomechanical testing in focused ion beam and scanning electron microscopes.
@en
P2093
A Sedlmayr
C A Volkert
D S Gianola
E Cyrankowski
O L Warren
S A S Asif
P2860
P304
P356
10.1063/1.3595423
P407
P577
2011-06-01T00:00:00Z