Review: automatic particle detection in electron microscopy.
about
A novel 3D wavelet-based filter for visualizing features in noisy biological data.Evaluation of denoising algorithms for biological electron tomography.Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization.Structure of six-transmembrane cation channels revealed by single-particle analysis from electron microscopic images.Texture indicators for segmentation of polyomavirus particles in transmission electron microscopy images.gEMpicker: a highly parallel GPU-accelerated particle picking tool for cryo-electron microscopy.Single Nanoparticle Detection Using Far-field Emission of Photonic Molecule around the Exceptional Point.Robust w-Estimators for Cryo-EM Class MeansVisualization of bionanostructures using transmission electron microscopical techniques.Progress and outlook in structural biology of large viral RNAs.Reference-free particle selection enhanced with semi-supervised machine learning for cryo-electron microscopy.Semi-automated selection of cryo-EM particles in RELION-1.3.Multi-reference-based multiple alignment statistics enables accurate protein-particle pickup from noisy images.Automated tracing of helical assemblies from electron cryo-micrographs.
P2860
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P2860
Review: automatic particle detection in electron microscopy.
description
2001 nî lūn-bûn
@nan
2001 թուականի Փետրուարին հրատարակուած գիտական յօդուած
@hyw
2001 թվականի փետրվարին հրատարակված գիտական հոդված
@hy
2001年の論文
@ja
2001年論文
@yue
2001年論文
@zh-hant
2001年論文
@zh-hk
2001年論文
@zh-mo
2001年論文
@zh-tw
2001年论文
@wuu
name
Review: automatic particle detection in electron microscopy.
@ast
Review: automatic particle detection in electron microscopy.
@en
Review: automatic particle detection in electron microscopy.
@nl
type
label
Review: automatic particle detection in electron microscopy.
@ast
Review: automatic particle detection in electron microscopy.
@en
Review: automatic particle detection in electron microscopy.
@nl
prefLabel
Review: automatic particle detection in electron microscopy.
@ast
Review: automatic particle detection in electron microscopy.
@en
Review: automatic particle detection in electron microscopy.
@nl
P356
P1476
Review: automatic particle detection in electron microscopy.
@en
P2093
Glaeser RM
Nicholson WV
P304
P356
10.1006/JSBI.2001.4348
P577
2001-02-01T00:00:00Z