Visualization and characterization of engineered nanoparticles in complex environmental and food matrices using atmospheric scanning electron microscopy.
about
Nanomaterials in consumer products: a challenging analytical problemContributed review: Review of integrated correlative light and electron microscopy.Characterization of engineered TiO₂ nanomaterials in a life cycle and risk assessments perspective.Analytical approaches for the characterization and quantification of nanoparticles in food and beverages.Hydrodynamic chromatography coupled to single-particle ICP-MS for the simultaneous characterization of AgNPs and determination of dissolved Ag in plasma and blood of burn patients.A uniform measurement expression for cross method comparison of nanoparticle aggregate size distributions.Cerium oxide nanoparticles induce oxidative stress in the sediment-dwelling amphipodCorophium volutator
P2860
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P2860
Visualization and characterization of engineered nanoparticles in complex environmental and food matrices using atmospheric scanning electron microscopy.
description
2013 nî lūn-bûn
@nan
2013 թուականի Փետրուարին հրատարակուած գիտական յօդուած
@hyw
2013 թվականի փետրվարին հրատարակված գիտական հոդված
@hy
2013年の論文
@ja
2013年論文
@yue
2013年論文
@zh-hant
2013年論文
@zh-hk
2013年論文
@zh-mo
2013年論文
@zh-tw
2013年论文
@wuu
name
Visualization and characteriza ...... scanning electron microscopy.
@ast
Visualization and characteriza ...... scanning electron microscopy.
@en
Visualization and characteriza ...... scanning electron microscopy.
@nl
type
label
Visualization and characteriza ...... scanning electron microscopy.
@ast
Visualization and characteriza ...... scanning electron microscopy.
@en
Visualization and characteriza ...... scanning electron microscopy.
@nl
prefLabel
Visualization and characteriza ...... scanning electron microscopy.
@ast
Visualization and characteriza ...... scanning electron microscopy.
@en
Visualization and characteriza ...... scanning electron microscopy.
@nl
P2093
P2860
P356
P1476
Visualization and characteriza ...... c scanning electron microscopy
@en
P2093
P2860
P356
10.1111/JMI.12014
P577
2013-02-15T00:00:00Z