Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources.
about
An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers.High-order harmonic generation using a high-repetition-rate turnkey laser.Nanometer resolution optical coherence tomography using broad bandwidth XUV and soft x-ray radiationNoncollinear Polarization Gating of Attosecond Pulse Trains in the Relativistic Regime.
P2860
Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources.
description
2013 nî lūn-bûn
@nan
2013 թուականի Փետրուարին հրատարակուած գիտական յօդուած
@hyw
2013 թվականի փետրվարին հրատարակված գիտական հոդված
@hy
2013年の論文
@ja
2013年論文
@yue
2013年論文
@zh-hant
2013年論文
@zh-hk
2013年論文
@zh-mo
2013年論文
@zh-tw
2013年论文
@wuu
name
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@ast
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@en
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@nl
type
label
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@ast
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@en
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@nl
prefLabel
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@ast
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@en
Sensitivity calibration of an ...... d extreme ultraviolet sources.
@nl
P2093
P2860
P356
P1476
Sensitivity calibration of an ...... nd extreme ultraviolet sources
@en
P2093
J Bierbach
P2860
P304
P356
10.1063/1.4788732
P407
P577
2013-02-01T00:00:00Z