Microinterferometry: Three-Dimensional Reconstruction of Surface Microtopography for Thin-Film and Wetting Studies by Reflection Interference Contrast Microscopy (RICM).
about
Dynamics of transient pores in stretched vesicles.Molecular force balance measurements reveal that double-stranded DNA unbinds under force in rate-dependent pathwaysInsect tricks: two-phasic foot pad secretion prevents slipping.A nanometre-scale resolution interference-based probe of interfacial phenomena between microscopic objects and surfaces.Wet but not slippery: Boundary friction in tree frog adhesive toe pads.Mechanisms of fluid production in smooth adhesive pads of insects.A force-based, parallel assay for the quantification of protein-DNA interactions.Parallel force assay for protein-protein interactions.Use of reflectance interference contrast microscopy to characterize the endothelial glycocalyx stiffness.Modulation of vesicle adhesion and spreading kinetics by hyaluronan cushions.Super-resolved thickness maps of thin film phantoms and in vivo visualization of tear film lipid layer using OCT.Quantitative detection of small molecule/DNA complexes employing a force-based and label-free DNA-microarray.Stabilizing method for reflection interference contrast microscopyA high-resolution magnetic tweezer for single-molecule measurements.Sequence-specific inhibition of Dicer measured with a force-based microarray for RNA ligands.Antagonist-induced deadhesion of specifically adhered vesicles.Elasto-capillarity in insect fibrillar adhesion.Interferometric scattering microscopy (iSCAT): new frontiers in ultrafast and ultrasensitive optical microscopy.Absolute 3D reconstruction of thin films topography in microfluidic channels by interference reflection microscopy.A high throughput molecular force assay for protein-DNA interactions.Capillary bridges between soft substrates.Signature of a Nonharmonic Potential as Revealed from a Consistent Shape and Fluctuation Analysis of an Adherent Membrane
P2860
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P2860
Microinterferometry: Three-Dimensional Reconstruction of Surface Microtopography for Thin-Film and Wetting Studies by Reflection Interference Contrast Microscopy (RICM).
description
1998 nî lūn-bûn
@nan
1998 թուականի Հոկտեմբերին հրատարակուած գիտական յօդուած
@hyw
1998 թվականի հոտեմբերին հրատարակված գիտական հոդված
@hy
1998年の論文
@ja
1998年論文
@yue
1998年論文
@zh-hant
1998年論文
@zh-hk
1998年論文
@zh-mo
1998年論文
@zh-tw
1998年论文
@wuu
name
Microinterferometry: Three-Dim ...... ce Contrast Microscopy (RICM).
@ast
Microinterferometry: Three-Dim ...... ce Contrast Microscopy (RICM).
@en
Microinterferometry: Three-Dim ...... terference Contrast Microscopy
@nl
type
label
Microinterferometry: Three-Dim ...... ce Contrast Microscopy (RICM).
@ast
Microinterferometry: Three-Dim ...... ce Contrast Microscopy (RICM).
@en
Microinterferometry: Three-Dim ...... terference Contrast Microscopy
@nl
prefLabel
Microinterferometry: Three-Dim ...... ce Contrast Microscopy (RICM).
@ast
Microinterferometry: Three-Dim ...... ce Contrast Microscopy (RICM).
@en
Microinterferometry: Three-Dim ...... terference Contrast Microscopy
@nl
P2093
P356
P1433
P1476
Microinterferometry: Three-Dim ...... ce Contrast Microscopy (RICM).
@en
P2093
Neumaier KR
Sackmann E
P304
P356
10.1364/AO.37.006892
P407
P577
1998-10-01T00:00:00Z