Comparison of Bi(1), Bi(3) and C(60) primary ion sources for ToF-SIMS imaging of patterned protein samples.
about
Mass spectrometry imaging and profiling of single cellsCorrelated imaging--a grand challenge in chemical analysisToF-SIMS imaging of molecular-level alteration mechanisms in Le Bonheur de vivre by Henri Matisse.Characterization of sample preparation methods of NIH/3T3 fibroblasts for ToF-SIMS analysis.Comparison of oil and egg tempera paint systems using time-of-flight secondary ion mass spectrometry
P2860
Comparison of Bi(1), Bi(3) and C(60) primary ion sources for ToF-SIMS imaging of patterned protein samples.
description
2011 nî lūn-bûn
@nan
2011 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի հունվարին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@ast
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@en
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@nl
type
label
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@ast
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@en
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@nl
prefLabel
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@ast
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@en
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@nl
P2093
P2860
P356
P1476
Comparison of Bi(1), Bi(3) and ...... of patterned protein samples.
@en
P2093
David G Castner
David W Grainger
Manish Dubey
P2860
P304
P356
10.1002/SIA.3537
P577
2011-01-01T00:00:00Z