Convenient preparation of high-quality specimens for annealing experiments in the transmission electron microscope.
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A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/transmission electron microscopes.In Situ Transmission Electron Microscopy Characterization and Manipulation of Two-Dimensional Layered Materials beyond Graphene.Quantitative TEM imaging of the magnetostructural and phase transitions in FeRh thin film systems.In situ TEM studies of micron-sized all-solid-state fluoride ion batteries: Preparation, prospects, and challenges.New experiments with a double crystal electron interferometer
P2860
Convenient preparation of high-quality specimens for annealing experiments in the transmission electron microscope.
description
2014 nî lūn-bûn
@nan
2014 թուականի Նոյեմբերին հրատարակուած գիտական յօդուած
@hyw
2014 թվականի նոյեմբերին հրատարակված գիտական հոդված
@hy
2014年の論文
@ja
2014年論文
@yue
2014年論文
@zh-hant
2014年論文
@zh-hk
2014年論文
@zh-mo
2014年論文
@zh-tw
2014年论文
@wuu
name
Convenient preparation of high ...... nsmission electron microscope.
@ast
Convenient preparation of high ...... nsmission electron microscope.
@en
type
label
Convenient preparation of high ...... nsmission electron microscope.
@ast
Convenient preparation of high ...... nsmission electron microscope.
@en
prefLabel
Convenient preparation of high ...... nsmission electron microscope.
@ast
Convenient preparation of high ...... nsmission electron microscope.
@en
P2860
P1476
Convenient preparation of high ...... nsmission electron microscope.
@en
P2093
P2860
P304
P356
10.1017/S1431927614013476
P577
2014-11-05T00:00:00Z