Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy.
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Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy.
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
Dielectrophoretic positioning ...... p-enhanced Raman spectroscopy.
@ast
Dielectrophoretic positioning ...... p-enhanced Raman spectroscopy.
@en
type
label
Dielectrophoretic positioning ...... p-enhanced Raman spectroscopy.
@ast
Dielectrophoretic positioning ...... p-enhanced Raman spectroscopy.
@en
prefLabel
Dielectrophoretic positioning ...... p-enhanced Raman spectroscopy.
@ast
Dielectrophoretic positioning ...... p-enhanced Raman spectroscopy.
@en
P2093
P2860
P356
P1433
P1476
Dielectrophoretic positioning ...... p-enhanced Raman spectroscopy.
@en
P2093
Christian Leiterer
Janina Wirth
Prabha Singh
Wolfgang Fritzsche
P2860
P304
P356
10.1002/ELPS.201400530
P577
2015-05-01T00:00:00Z