Accurate characterization of SiO2 thin films using surface acoustic waves.
about
Accurate characterization of SiO2 thin films using surface acoustic waves.
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
Accurate characterization of SiO2 thin films using surface acoustic waves.
@ast
Accurate characterization of SiO2 thin films using surface acoustic waves.
@en
type
label
Accurate characterization of SiO2 thin films using surface acoustic waves.
@ast
Accurate characterization of SiO2 thin films using surface acoustic waves.
@en
prefLabel
Accurate characterization of SiO2 thin films using surface acoustic waves.
@ast
Accurate characterization of SiO2 thin films using surface acoustic waves.
@en
P2093
P1476
Accurate characterization of SiO2 thin films using surface acoustic waves
@en
P2093
Alexey M Lomonosov
Andreas P Mayer
Hans-Peter Kirschner
Ingo Bleyl
Matthias Honal
Matthias Knapp
Paul Warkentin
Philipp M Jäger
Werner Ruile
P304
P356
10.1109/TUFFC.2014.006921
P577
2015-04-01T00:00:00Z