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A fast image simulation algorithm for scanning transmission electron microscopy.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.
P2860
description
2016 nî lūn-bûn
@nan
2016年の論文
@ja
2016年論文
@yue
2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
2016年论文
@zh
2016年论文
@zh-cn
name
Computation in electron microscopy.
@ast
Computation in electron microscopy.
@en
type
label
Computation in electron microscopy.
@ast
Computation in electron microscopy.
@en
prefLabel
Computation in electron microscopy.
@ast
Computation in electron microscopy.
@en
P2860
P1476
Computation in electron microscopy.
@en
P2093
Earl J Kirkland
P2860
P356
10.1107/S205327331501757X
P577
2016-01-01T00:00:00Z