Resolution and contrast enhancement of subtractive second harmonic generation microscopy with a circularly polarized vortex beam.
about
Intensity Weighted Subtraction Microscopy Approach for Image Contrast and Resolution Enhancement.Application of an advanced maximum likelihood estimation restoration method for enhanced-resolution and contrast in second-harmonic generation microscopy.Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy.
P2860
Resolution and contrast enhancement of subtractive second harmonic generation microscopy with a circularly polarized vortex beam.
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
Resolution and contrast enhanc ...... cularly polarized vortex beam.
@ast
Resolution and contrast enhanc ...... cularly polarized vortex beam.
@en
type
label
Resolution and contrast enhanc ...... cularly polarized vortex beam.
@ast
Resolution and contrast enhanc ...... cularly polarized vortex beam.
@en
prefLabel
Resolution and contrast enhanc ...... cularly polarized vortex beam.
@ast
Resolution and contrast enhanc ...... cularly polarized vortex beam.
@en
P2093
P2860
P356
P1433
P1476
Resolution and contrast enhanc ...... cularly polarized vortex beam.
@en
P2093
P2860
P2888
P356
10.1038/SREP13580
P407
P577
2015-09-14T00:00:00Z