Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
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Dissipation signals due to lateral tip oscillations in FM-AFM.Influence of the adsorption geometry of PTCDA on Ag(111) on the tip-molecule forces in non-contact atomic force microscopyThree-dimensional interaction force and tunneling current spectroscopy of point defects on rutile TiO2(110)Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesAtom-specific forces and defect identification on surface-oxidized Cu(100) with combined 3D-AFM and STM measurements
P2860
Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
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2012 nî lūn-bûn
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2012年の論文
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2012年学术文章
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2012年学术文章
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2012年学术文章
@zh-hans
2012年学术文章
@zh-my
2012年学术文章
@zh-sg
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Probing three-dimensional surf ...... ations, and artifact reduction
@ast
Probing three-dimensional surf ...... ations, and artifact reduction
@en
type
label
Probing three-dimensional surf ...... ations, and artifact reduction
@ast
Probing three-dimensional surf ...... ations, and artifact reduction
@en
prefLabel
Probing three-dimensional surf ...... ations, and artifact reduction
@ast
Probing three-dimensional surf ...... ations, and artifact reduction
@en
P2093
P2860
P356
P1476
Probing three-dimensional surf ...... ations, and artifact reduction
@en
P2093
Eric I Altman
Harry Mönig
Mehmet Z Baykara
Omur E Dagdeviren
Todd C Schwendemann
Udo D Schwarz
P2860
P304
P356
10.3762/BJNANO.3.73
P577
2012-09-11T00:00:00Z