Major complications associated with transcatheter atrial septal occluder implantation: a review of the medical literature and the manufacturer and user facility device experience (MAUDE) database.
about
Prevalence of deficient retro-aortic rim and its effects on outcomes in device closure of atrial septal defectsAnalysis of the US Food and Drug Administration Manufacturer and User Facility Device Experience database for adverse events involving Amplatzer septal occluder devices and comparison with the Society of Thoracic Surgery congenital cardiac surgery dSingle center experience: Implantation failures, early, and late complications after implantation of a partially biodegradable ASD/PFO-device (BioStar®).Transcatheter closure of atrial septal defects in children, middle-aged adults, and older adults: failure rates, early complications; and balloon sizing effects.Noninvasive imaging of prosthetic cardiac devices.Percutaneous atrial septal occluder devices and cardiac erosion: a review of the literature.A strategy for atrial septal defect closure in small children that eliminates long-term wall erosion risk.Atrial septum defect closure device in a beating heart, from the perspective of a researcher in artificial organs.Mid-term outcomes of the Helex septal occluder for percutaneous closure of secundum atrial septal defects.Infective endocarditis after device closure of atrial septal defects: Case report and review of the literature.The influence of deficient retro-aortic rim on technical success and early adverse events following device closure of secundum atrial septal defects: An Analysis of the IMPACT Registry®.Enhanced prothrombin formation and platelet activation in Chinese patients after transcatheter closure of atrial septal defect.Transcatheter device closure of atrial septal defects: more to think about than just closing the hole.Increasing propensity to pursue operative closure of atrial septal defects following changes in the instructions for use of the Amplatzer Septal Occluder device: An observational study using data from the Pediatric Health Information Systems databasValidation of a Prescreening Program for Transcatheter Atrial Septal Defect Closure.Risk factors and prognosis of atrioventricular block after atrial septum defect closure using the Amplatzer device.Patent foramen ovale
P2860
Q34203252-D58DD50A-768E-4773-8560-B7FECF170497Q34503740-E5ADFA9F-2058-4D9E-AD94-3C123D1E01E3Q35522397-A8E764E3-B147-418C-99FA-C187130661B5Q36072215-5FBF4F86-7AC7-4A37-895F-CB1F9A937135Q37857868-9B9BC3B6-2373-4BCA-8AAA-4CBC0C7945DAQ38007112-982A0A13-258D-4EEB-8E6F-4F86A618ED85Q38013744-4B976E7C-AF5C-4CD8-B9CB-2F5C72F08928Q38021360-5579D702-C633-4695-A6F2-037628571A5DQ38085350-47243F5A-E031-4154-AAB9-AFC8752AFC71Q38958010-280A49EC-CBE7-46F1-BD3A-3514CEB0C70AQ39758773-F0FE4A70-EF1C-4DD2-ABA4-A98CC9376A54Q43019188-51AF2D41-EC8C-4704-BD0F-E662B18F151DQ47404445-C6D9C240-7F83-42F8-B418-8801A9C4F669Q47645804-CC7F45BF-0B46-4EB0-B43E-5BC200221CC3Q53287303-03C26D4E-672F-4E5A-BE1C-981D1A61AFE3Q54678931-6AF607CE-9428-428A-B131-D892FB1AB0D9Q59191961-8A94F75E-DA69-4ADB-93F3-671ABFF0FF6F
P2860
Major complications associated with transcatheter atrial septal occluder implantation: a review of the medical literature and the manufacturer and user facility device experience (MAUDE) database.
description
article científic
@ca
article scientifique
@fr
articolo scientifico
@it
artigo científico
@pt
bilimsel makale
@tr
scientific article published on July 2007
@en
vedecký článok
@sk
vetenskaplig artikel
@sv
videnskabelig artikel
@da
vědecký článek
@cs
name
Major complications associated ...... e experience (MAUDE) database.
@en
Major complications associated ...... ser facility device experience
@nl
type
label
Major complications associated ...... e experience (MAUDE) database.
@en
Major complications associated ...... ser facility device experience
@nl
prefLabel
Major complications associated ...... e experience (MAUDE) database.
@en
Major complications associated ...... ser facility device experience
@nl
P2093
P2860
P1476
Major complications associated ...... e experience (MAUDE) database.
@en
P2093
Jeffrey W Delaney
Jennifer S Li
John F Rhodes
P2860
P304
P356
10.1111/J.1747-0803.2007.00107.X
P577
2007-07-01T00:00:00Z