Removing material using atomic force microscopy with single- and multiple-tip sources. - Wikidata - awgldk - TriplyDB

Removing material using atomic force microscopy with single- and multiple-tip sources.

Removing material using atomic force microscopy with single- and multiple-tip sources.

http://www.wikidata.org/entity/Q37943782

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Advanced scanning probe lithography Opportunities in high-speed atomic force microscopy.Fabrication and measurement of nanostructures on the micro ball surface using a modified atomic force microscope.Effect of the molecular weight on deformation states of the polystyrene film by AFM single scanning.Nondestructive tribochemistry-assisted nanofabrication on GaAs surface.Automatic hammering of nano-patterns on special polymer film by using a vibrating AFM tip pH-Dependent Formation and Disintegration of the Influenza A Virus Protein Scaffold To Provide Tension for Membrane Fusion Plow and ridge nanofabrication.Fabrication of Nanoscale Pits with High Throughput on Polymer Thin Film Using AFM Tip-Based Dynamic Plowing Lithography Understanding the mutual impact of interaction between hydrophobic nanoparticles and pulmonary surfactant monolayer.Liquid-mediated three-dimensional scanning probe nanosculpting.A novel AFM-based 5-axis nanoscale machine tool for fabrication of nanostructures on a micro ball.Mesoscopic physical removal of material using sliding nano-diamond contacts.

P2860

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P2860

Removing material using atomic force microscopy with single- and multiple-tip sources.

http://www.wikidata.org/entity/Q37943782

description

article científic

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article scientifique

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articol științific

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articolo scientifico

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artigo científico

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artigo científico

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artigo científico

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artikel ilmiah

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artikull shkencor

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artículo científico

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name

Removing material using atomic force microscopy with single- and multiple-tip sources.

@en

Removing material using atomic force microscopy with single- and multiple-tip sources.

@nl

type

label

Removing material using atomic force microscopy with single- and multiple-tip sources.

@en

Removing material using atomic force microscopy with single- and multiple-tip sources.

@nl

prefLabel

Removing material using atomic force microscopy with single- and multiple-tip sources.

@en

Removing material using atomic force microscopy with single- and multiple-tip sources.

@nl

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Removing material using atomic force microscopy with single- and multiple-tip sources.

@en

P2093

Ampere A Tseng

http://www.w3.org/2001/XMLSchema#string

P2860

Atomic force microscope

Nanoscale three-dimensional patterning of molecular resists by scanning probes

Top-Down Nanomechanical Machining of Three-Dimensional Nanostructures by Atomic Force Microscopy

Direct writing and characterization of poly(p-phenylene vinylene) nanostructures

Nanosurgery: observation of peptidoglycan strands in Lactobacillus helveticus cell walls.

High-speed, sub-15 nm feature size thermochemical nanolithography.

Machining oxide thin films with an atomic force microscope: pattern and object formation on the nanometer scale.

The force needed to move an atom on a surface.

Dynamic superlubricity and the elimination of wear on the nanoscale.

Atomic force microscopy as a tool for atom manipulation.

P304

3409-3427

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scholarly article

P356

10.1002/SMLL.201100486

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24

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7

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2011-10-10T00:00:00Z

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21984470

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