about
Outrunning damage: Electrons vs X-rays-timescales and mechanisms.On the threshold conditions for electron beam damage of asbestos amosite fibers in the transmission electron microscope (TEM).Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscopeElectron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces.Nanowire growth kinetics in aberration corrected environmental transmission electron microscopy.Nanoscale controlled Li-insertion reaction induced by scanning electron-beam irradiation in a Li4Ti5O12 electrode material for lithium-ion batteries.Implementing an accurate and rapid sparse sampling approach for low-dose atomic resolution STEM imagingInterfacial Defects Dictated In Situ Fabrication of Yolk-Shell Upconversion Nanoparticles by Electron-Beam Irradiation
P2860
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P2860
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
Electron beam damage in oxides: a review.
@en
type
label
Electron beam damage in oxides: a review.
@en
prefLabel
Electron beam damage in oxides: a review.
@en
P356
P1476
Electron beam damage in oxides: a review.
@en
P2093
P304
P356
10.1088/0034-4885/79/1/016501
P407
P577
2015-12-18T00:00:00Z