about
The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning.3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size.Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.Functional electrospun polystyrene nanofibers incorporating α-, β-, and γ-cyclodextrins: comparison of molecular filter performance.The 3D OrbiSIMS-label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power.Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources.Intracellular Drug Uptake-A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS.Embedding-Free Method for Preparation of Cross-Sections of Organic Materials for Micro Chemical Analysis Using Gas Cluster Ion Beam Sputtering.Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.Determination of the sputtering yield of cholesterol using Arn(+) and C60(+(+)) cluster ions.Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry.Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample.SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions.Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organicsDirect electrospinning of Ag/polyvinylpyrrolidone nanocablesArgon cluster ion source evaluation on lipid standards and rat brain tissue samplesSampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth ProfilesChemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry
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Q33440232-FE6BBDFB-FB90-448C-970E-1CD081F21117Q39063781-A824A07F-90D7-49AD-A616-8439F2B88F9FQ40483828-B4836BB3-1B25-48C0-8489-07494EBEB97CQ40588132-197F0B10-1A04-4AD7-B8B0-E3E61FC3EBA9Q40703705-C3AD00B6-C22D-4CDC-9423-A12D7AE7E108Q42934229-CC8E978C-0AE2-4226-8A5D-05B504069FA0Q46262837-D76B3B0C-A7DF-417A-956E-5822CDCECEE5Q46460101-75836A0F-832B-4B68-8094-89A3FCEB7083Q46535270-53DF7759-E05E-4134-A011-4BDE57F65EA1Q46589830-4EB979DC-7EBD-49DE-9BFB-F9C3C9CEF5ECQ47778401-70DB61A7-4545-43A3-A111-1820AC3B0A13Q48297520-3628D23F-7FD6-42AA-B806-6C7867DA0448Q48725695-0026733D-B05F-4D2F-A188-EF5A76319041Q50627860-E7068BAB-D70E-41B9-A201-CDED837E2936Q50660595-290D51E1-BE94-411F-BE0E-9A0DD2C04BB7Q51775174-130F3C61-9195-4910-9037-E0659F45C8E0Q55248623-45A1E677-2A03-442F-AFAA-CA4923B15412Q57100572-C00578D1-348A-496A-90A6-00E16C81D239Q61758906-3FCAE070-6DB5-4F40-B606-2E64F375F7E5Q87130363-C62231D8-A84D-4D72-90C8-F4A156D7CDACQ87305144-654C280C-F827-461F-8D52-B7D3F0B70622Q90862082-1F969CEA-785F-48E6-B152-0D15073A3C5D
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description
hulumtues
@sq
onderzoeker
@nl
researcher
@en
հետազոտող
@hy
name
Rasmus Havelund
@ast
Rasmus Havelund
@en
Rasmus Havelund
@es
Rasmus Havelund
@nl
Rasmus Havelund
@sl
type
label
Rasmus Havelund
@ast
Rasmus Havelund
@en
Rasmus Havelund
@es
Rasmus Havelund
@nl
Rasmus Havelund
@sl
prefLabel
Rasmus Havelund
@ast
Rasmus Havelund
@en
Rasmus Havelund
@es
Rasmus Havelund
@nl
Rasmus Havelund
@sl
P106
P1153
26032146700
P21
P31
P496
0000-0001-7316-9761