Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS.
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Provenance information as a tool for addressing engineered nanoparticle reproducibility challengesAdapting Bobbert-Vlieger model to spectroscopic ellipsometry of gold nanoparticles with bio-organic shells.Lead-free perovskite solar cells using Sb and Bi-based A3B2X9 and A3BX6 crystals with normal and inverse cell structures.Multitechnique characterization of oligo(ethylene glycol) functionalized gold nanoparticles.
P2860
Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS.
description
2016 nî lūn-bûn
@nan
2016年の論文
@ja
2016年論文
@yue
2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
2016年论文
@zh
2016年论文
@zh-cn
name
Versailles Project on Advanced ...... e Coatings Using XPS and LEIS.
@en
Versailles Project on Advanced ...... e Coatings Using XPS and LEIS.
@nl
type
label
Versailles Project on Advanced ...... e Coatings Using XPS and LEIS.
@en
Versailles Project on Advanced ...... e Coatings Using XPS and LEIS.
@nl
prefLabel
Versailles Project on Advanced ...... e Coatings Using XPS and LEIS.
@en
Versailles Project on Advanced ...... e Coatings Using XPS and LEIS.
@nl
P2093
P2860
P50
P356
P1476
Versailles Project on Advanced ...... le Coatings Using XPS and LEIS
@en
P2093
Bernd Bock
Carlos E Galhardo
Caterina Minelli
David G Castner
Giacomo Ceccone
Henry S Luftman
Henryk Kalbe
Jacobus M Sturm
Jeong Won Kim
P2860
P304
24070-24079
P356
10.1021/ACS.JPCC.6B06713
P50
P577
2016-09-13T00:00:00Z