Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
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Overview of Probe-based Storage TechnologiesApplication of phase-change materials in memory taxonomy.Direct manufacturing of ultrathin graphite on three-dimensional nanoscale features.Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopy.Optimisation of readout performance of phase-change probe memory in terms of capping layer and probe tipPotential of ITO thin film for electrical probe memory applications
P2860
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
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2009 nî lūn-bûn
@nan
2009年の論文
@ja
2009年学术文章
@wuu
2009年学术文章
@zh-cn
2009年学术文章
@zh-hans
2009年学术文章
@zh-my
2009年学术文章
@zh-sg
2009年學術文章
@yue
2009年學術文章
@zh
2009年學術文章
@zh-hant
name
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
@en
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
@nl
type
label
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
@en
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
@nl
prefLabel
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
@en
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.
@nl
P2093
P356
P1433
P1476
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies
@en
P2093
Abu Sebastian
Michel Despont
Ute Drechsler
P304
P356
10.1088/0957-4484/20/10/105701
P577
2009-02-17T00:00:00Z