In situ characterization of nanowire dimensions and growth dynamics by optical reflectance.
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Diameter Dependence of Planar Defects in InP NanowiresIn situ fabrication and investigation of nanostructures and nanodevices with a microscope.Three Dimensional Sculpturing of Vertical Nanowire Arrays by Conventional Photolithography.Evolution of opto-electronic properties during film formation of complex semiconductors.In Situ Characterization of Interfaces Relevant for Efficient Photoinduced Reactions
P2860
In situ characterization of nanowire dimensions and growth dynamics by optical reflectance.
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2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
In situ characterization of na ...... namics by optical reflectance.
@en
type
label
In situ characterization of na ...... namics by optical reflectance.
@en
prefLabel
In situ characterization of na ...... namics by optical reflectance.
@en
P2093
P1433
P1476
In situ characterization of na ...... namics by optical reflectance.
@en
P2093
Christian Camus
Magnus Heurlin
Nicklas Anttu
P304
P356
10.1021/ACS.NANOLETT.5B01107
P407
P577
2015-04-02T00:00:00Z