Component analysis of a new Solid State X-ray Image Intensifier (SSXII) using photon transfer and Instrumentation Noise Equivalent Exposure (INEE) measurements.
about
Accurate MTF measurement in digital radiography using noise response.Component Level Modular Design of a Solid State X-ray Image Intensifier for an M×N Array.Performance Trade-Off Analysis Comparing Different Front-End Configurations for a Digital X-ray Imager.Two dimensional extensible array configuration for EMCCD-based solid state x-ray detectors.EMCCD-based high resolution dynamic x-ray detector for neurovascular interventions.Graphical User Interface for a Dual-Module EMCCD X-ray Detector Array.A method for the determination of the two-dimensional MTF of digital radiography systems using only the noise responseThe Solid State X-ray Image Intensifier (SSXII) in Single Photon Counting (SPC) mode.Measuring the presampled MTF from a reduced number of flat-field images using the Noise Response (NR) method.Evaluation of intracranial aneurysm coil embolization in phantoms and patients using a high-resolution Microangiographic Fluoroscope (MAF).Dose Reduction Technique Using a Combination of a Region of Interest (ROI) Material X-Ray Attenuator and Spatially Different Temporal Filtering for Fluoroscopic Interventions.Quantum Performance Analysis of an EMCCD-based X-ray Detector Using Photon Transfer Technique
P2860
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P2860
Component analysis of a new Solid State X-ray Image Intensifier (SSXII) using photon transfer and Instrumentation Noise Equivalent Exposure (INEE) measurements.
description
2009 nî lūn-bûn
@nan
2009年の論文
@ja
2009年論文
@yue
2009年論文
@zh-hant
2009年論文
@zh-hk
2009年論文
@zh-mo
2009年論文
@zh-tw
2009年论文
@wuu
2009年论文
@zh
2009年论文
@zh-cn
name
Component analysis of a new So ...... Exposure (INEE) measurements.
@en
type
label
Component analysis of a new So ...... Exposure (INEE) measurements.
@en
prefLabel
Component analysis of a new So ...... Exposure (INEE) measurements.
@en
P2093
P2860
P356
P1433
P1476
Component analysis of a new So ...... Exposure (INEE) measurements.
@en
P2093
Andrew Kuhls-Gilcrist
Daniel R Bednarek
Stephen Rudin
P2860
P304
7258171-72581710
P356
10.1117/12.813957
P577
2009-01-01T00:00:00Z