Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy.
about
Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times.Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy.Theory of Single-Impact Atomic Force Spectroscopy in liquids with material contrast.
P2860
Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy.
description
2017 nî lūn-bûn
@nan
2017年の論文
@ja
2017年論文
@yue
2017年論文
@zh-hant
2017年論文
@zh-hk
2017年論文
@zh-mo
2017年論文
@zh-tw
2017年论文
@wuu
2017年论文
@zh
2017年论文
@zh-cn
name
Analysis and modification of d ...... modal atomic force microscopy.
@en
Analysis and modification of d ...... modal atomic force microscopy.
@nl
type
label
Analysis and modification of d ...... modal atomic force microscopy.
@en
Analysis and modification of d ...... modal atomic force microscopy.
@nl
prefLabel
Analysis and modification of d ...... modal atomic force microscopy.
@en
Analysis and modification of d ...... modal atomic force microscopy.
@nl
P2093
P2860
P356
P1476
Analysis and modification of d ...... modal atomic force microscopy.
@en
P2093
Alfredo J Diaz
Hanaul Noh
Santiago D Solares
P2860
P304
P356
10.3762/BJNANO.8.62
P577
2017-03-08T00:00:00Z