Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films.
about
The relevance of interfaces for oxide ion transport in yttria stabilized zirconia (YSZ) thin films.Oxygen tracer diffusion along interfaces of strained Y2O3/YSZ multilayers.18O-tracer diffusion along nanoscaled Sc2O3/yttria stabilized zirconia (YSZ) multilayers: on the influence of strainOxygen transport in epitaxial SrTiO<sub>3</sub>/SrTi<sub>1 − <i>x</i></sub>Fe<sub><i>x</i></sub>O<sub>3</sub> multilayer stacks
P2860
Measurement of (18)O tracer diffusion coefficients in thin yttria stabilized zirconia films.
description
2011 nî lūn-bûn
@nan
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
2011年论文
@zh
2011年论文
@zh-cn
name
Measurement of (18)O tracer di ...... ria stabilized zirconia films.
@en
type
label
Measurement of (18)O tracer di ...... ria stabilized zirconia films.
@en
prefLabel
Measurement of (18)O tracer di ...... ria stabilized zirconia films.
@en
P2093
P2860
P1433
P1476
Measurement of (18)O tracer di ...... tria stabilized zirconia films
@en
P2093
A Schintlmeister
P2860
P356
10.1016/J.SSI.2010.08.013
P577
2011-03-01T00:00:00Z