about
Hybridization approach to in-line and off-axis (electron) holography for superior resolution and phase sensitivity.Quantitative electron phase imaging with high sensitivity and an unlimited field of view.Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.Compositional and electrical properties of line and planar defects in Cu(In,Ga)Se2thin films for solar cells - a review
P2860
description
2013 nî lūn-bûn
@nan
2013年の論文
@ja
2013年学术文章
@wuu
2013年学术文章
@zh
2013年学术文章
@zh-cn
2013年学术文章
@zh-hans
2013年学术文章
@zh-my
2013年学术文章
@zh-sg
2013年學術文章
@yue
2013年學術文章
@zh-hant
name
Towards full-resolution inline electron holography.
@en
Towards full-resolution inline electron holography.
@nl
type
label
Towards full-resolution inline electron holography.
@en
Towards full-resolution inline electron holography.
@nl
prefLabel
Towards full-resolution inline electron holography.
@en
Towards full-resolution inline electron holography.
@nl
P1433
P1476
Towards full-resolution inline electron holography.
@en
P2093
Christoph T Koch
P356
10.1016/J.MICRON.2013.10.009
P577
2013-10-31T00:00:00Z