Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledge.
about
Real-space post-processing correction of thermal drift and piezoelectric actuator nonlinearities in scanning tunneling microscope images.Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways.Atomic lattice disorder in charge-density-wave phases of exfoliated dichalcogenides (1T-TaS2).Highly tensile-strained Ge/InAlAs nanocomposites.Strain mapping accuracy improvement using super-resolution techniques.Atom column indexing: atomic resolution image analysis through a matrix representation.Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy.A reliable approach to prepare brittle semiconducting materials for cross-sectional transmission electron microscopy.Improving Signal-to-Noise Ratio in Scanning Transmission Electron Microscopy Energy-Dispersive X-Ray (STEM-EDX) Spectrum Images Using Single-Atomic-Column Cross-Correlation Averaging.Surface relaxation of strained Ga(P,As)/GaP heterostructures investigated by HAADF STEM.Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging.Periodic artifact reduction in Fourier transforms of full field atomic resolution images.Maximising the resolving power of the scanning tunneling microscope.Spin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCoSi Doped Hafnium Oxide-A “Fragile” Ferroelectric SystemStructural and electrical properties of single crystalline SrZrO3 epitaxially grown on Ge (001)The role of ceramic and glass science research in meeting societal challenges: Report from an NSF-sponsored workshopComparison of thermoelectric properties of nanostructured Mg2Si, FeSi2, SiGe, and nanocomposites of SiGe–Mg2Si, SiGe–FeSi2Structural Changes Underlying Field-Cycling Phenomena in Ferroelectric HfO2Thin FilmsPhysical Mechanisms behind the Field-Cycling Behavior of HfO2 -Based Ferroelectric CapacitorsStructure and chemistry of passivated SiC/SiO2 interfacesOn the structural origins of ferroelectricity in HfO2 thin filmsDirect observation of charge mediated lattice distortions in complex oxide solid solutionsLarge area strain analysis using scanning transmission electron microscopy across multiple images
P2860
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P2860
Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledge.
description
2013 nî lūn-bûn
@nan
2013年の論文
@ja
2013年学术文章
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2013年学术文章
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2013年学术文章
@zh-cn
2013年学术文章
@zh-hans
2013年学术文章
@zh-my
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@zh-sg
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@yue
2013年學術文章
@zh-hant
name
Revolving scanning transmissio ...... rtion without prior knowledge.
@en
Revolving scanning transmissio ...... rtion without prior knowledge.
@nl
type
label
Revolving scanning transmissio ...... rtion without prior knowledge.
@en
Revolving scanning transmissio ...... rtion without prior knowledge.
@nl
prefLabel
Revolving scanning transmissio ...... rtion without prior knowledge.
@en
Revolving scanning transmissio ...... rtion without prior knowledge.
@nl
P1433
P1476
Revolving scanning transmissio ...... rtion without prior knowledge.
@en
P2093
James M LeBeau
P356
10.1016/J.ULTRAMIC.2013.12.004
P50
P577
2013-12-31T00:00:00Z