TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
about
Secondary ion mass spectrometry imaging of Dictyostelium discoideum aggregation streamsImaging mass spectrometry in neuroscience.Small molecule analysis and imaging of fatty acids in the zebra finch song system using time-of-flight-secondary ion mass spectrometryMS/MS methodology to improve subcellular mapping of cholesterol using TOF-SIMSMolecular dynamics simulations of sputtering of Langmuir-Blodgett multilayers by keV C(60) projectiles.Biological cluster mass spectrometry.Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling.Analysis of native biological surfaces using a 100 kV massive gold cluster source.Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60 and giant argon gas cluster sourcesDirect comparison of Au(3)(+) and C(60)(+) cluster projectiles in SIMS molecular depth profilingFreeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells.Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energyChemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry.Energy deposition during molecular depth profiling experiments with cluster ion beams.Which is more important in bioimaging SIMS experiments-The sample preparation or the nature of the projectile?Mass Spectrometry of Nanoparticles is Different.Discrimination of prostate cancer cells and non-malignant cells using secondary ion mass spectrometry.Lipid specific molecular ion emission as a function of the primary ion characteristics in TOF-SIMS.Measuring the internal energies of species emitted from hypervelocity nanoprojectile impacts on surfaces using recalibrated benzylpyridinium probe ions.Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic Multilayers.
P2860
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P2860
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
description
2006 nî lūn-bûn
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2006年の論文
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2006年学术文章
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2006年学术文章
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2006年学术文章
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2006年学术文章
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2006年學術文章
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name
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
@en
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
@nl
type
label
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
@en
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
@nl
prefLabel
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
@en
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
@nl
P2093
P356
P1433
P1476
TOF-SIMS analysis using C60. Effect of impact energy on yield and damage
@en
P2093
Greg Biddulph
John C Vickerman
John S Fletcher
Nicholas P Lockyer
P304
P356
10.1021/AC051624W
P407
P577
2006-03-01T00:00:00Z