Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications.
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Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications.
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2017 nî lūn-bûn
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2017年の論文
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2017年学术文章
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2017年学术文章
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2017年学术文章
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2017年学术文章
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2017年学术文章
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2017年學術文章
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Broadband Dielectric Spectrosc ...... d Nanoelectronic Applications.
@en
Broadband Dielectric Spectrosc ...... d Nanoelectronic Applications.
@nl
type
label
Broadband Dielectric Spectrosc ...... d Nanoelectronic Applications.
@en
Broadband Dielectric Spectrosc ...... d Nanoelectronic Applications.
@nl
prefLabel
Broadband Dielectric Spectrosc ...... d Nanoelectronic Applications.
@en
Broadband Dielectric Spectrosc ...... d Nanoelectronic Applications.
@nl
P2093
P2860
P356
P1476
Broadband Dielectric Spectrosc ...... d Nanoelectronic Applications.
@en
P2093
Christopher E Sunday
Karl R Montgomery
Papa K Amoah
Yaw S Obeng
P2860
P304
P356
10.1149/2.0141709JSS
P577
2017-08-29T00:00:00Z